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    <title>EETOP 创芯网论坛 (原名：电子顶级开发网) - 资料区</title>
    <link>https://bbs.eetop.wang/forum-321-1.html</link>
    <description>Latest 20 threads of 资料区</description>
    <copyright>Copyright(C) EETOP 创芯网论坛 (原名：电子顶级开发网)</copyright>
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      <title>EETOP 创芯网论坛 (原名：电子顶级开发网)</title>
      <link>https://bbs.eetop.wang/</link>
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      <title>爱德万测试技术市场展望slides三份</title>
      <link>https://bbs.eetop.wang/thread-995229-1-1.html</link>
      <description><![CDATA[]]></description>
      <category>资料区</category>
      <author>fangl12</author>
      <pubDate>Tue, 16 Sep 2025 07:47:00 +0000</pubDate>
    </item>
    <item>
      <title>求UltraFlex和J750的DIB pad定位信息</title>
      <link>https://bbs.eetop.wang/thread-995214-1-1.html</link>
      <description><![CDATA[如题，求UltraFlex和J750的DIB pad定位信息，最好能包含常用板卡的pad位置，如果能直接发一个可编辑的pcb源文件最好啦，]]></description>
      <category>资料区</category>
      <author>去死吧</author>
      <pubDate>Tue, 16 Sep 2025 03:04:13 +0000</pubDate>
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    <item>
      <title>【FA】《Microelectronics Failure Analysis Desk Reference》6th edition 2011</title>
      <link>https://bbs.eetop.wang/thread-995043-1-1.html</link>
      <description><![CDATA[As the semiconductor industry moves from the “micro” to the “nano” realm, the Failure Analysis community needs to be pro-active in maintaining its ability to verify, isolate, uncover, and identify the root-cause of problems. These problems may be ...]]></description>
      <category>资料区</category>
      <author>kylinchan</author>
      <pubDate>Thu, 11 Sep 2025 06:16:04 +0000</pubDate>
    </item>
    <item>
      <title>《现代示波器高级应用——测试及使用技巧》</title>
      <link>https://bbs.eetop.wang/thread-994829-1-1.html</link>
      <description><![CDATA[《现代示波器高级应用——测试及使用技巧》是由李凯编著、清华大学出版社出版的电子测量技术书籍，基于数字示波器技术演进背景，结合材料、芯片与计算机技术融合趋势编纂而成 [1]。 全书系统解析数字示波器原理及操作技巧，涵盖带宽、采样率等技术指标，探头的负载效应 ...]]></description>
      <category>资料区</category>
      <author>ttliu666</author>
      <pubDate>Sun, 07 Sep 2025 02:08:07 +0000</pubDate>
    </item>
    <item>
      <title>SMT offline 环境</title>
      <link>https://bbs.eetop.wang/thread-994261-1-1.html</link>
      <description><![CDATA[哪位佬有SMT7/8 的offline 环境可以分享？]]></description>
      <category>资料区</category>
      <author>LXRN</author>
      <pubDate>Tue, 26 Aug 2025 15:54:48 +0000</pubDate>
    </item>
    <item>
      <title>经典半导体测试数籍---The Fundamentals Of Digital Semiconductor Testing中文版</title>
      <link>https://bbs.eetop.wang/thread-994230-1-1.html</link>
      <description><![CDATA[业界经典IC测试书籍：The Fundamentals Of Digital Semiconductor Testing 中文版

第一章.认识半导体和测试设备.............................................................................................. 3 
一、晶圆、晶片和封装........................... ...]]></description>
      <category>资料区</category>
      <author>GRITG</author>
      <pubDate>Tue, 26 Aug 2025 07:41:57 +0000</pubDate>
    </item>
    <item>
      <title>V93K测试log STDF格式的数据 转化为excel格式</title>
      <link>https://bbs.eetop.wang/thread-994139-1-1.html</link>
      <description><![CDATA[分享两个工具，一个可以解析STDFlog，离线打开测试数据，数据界面V93K 相似并且进行数据分析   


另一个是可以将stdf数据，转换为excel 表格]]></description>
      <category>资料区</category>
      <author>GRITG</author>
      <pubDate>Mon, 25 Aug 2025 05:59:41 +0000</pubDate>
    </item>
    <item>
      <title>V93K测试机，测试完SCAN pattern 后，将fail的行以及对应的pin 保存在log中</title>
      <link>https://bbs.eetop.wang/thread-994138-1-1.html</link>
      <description><![CDATA[]]></description>
      <category>资料区</category>
      <author>GRITG</author>
      <pubDate>Mon, 25 Aug 2025 05:43:02 +0000</pubDate>
    </item>
    <item>
      <title>ICEPT 2025 Paper share--mulichip microsystem</title>
      <link>https://bbs.eetop.wang/thread-993715-1-1.html</link>
      <description><![CDATA[]]></description>
      <category>资料区</category>
      <author>Taylor0808</author>
      <pubDate>Fri, 15 Aug 2025 12:21:42 +0000</pubDate>
    </item>
    <item>
      <title>34410A原理图</title>
      <link>https://bbs.eetop.wang/thread-993577-1-1.html</link>
      <description><![CDATA[34410A原理图]]></description>
      <category>资料区</category>
      <author>allen321678</author>
      <pubDate>Wed, 13 Aug 2025 00:52:07 +0000</pubDate>
    </item>
    <item>
      <title>3458A原理图</title>
      <link>https://bbs.eetop.wang/thread-993576-1-1.html</link>
      <description><![CDATA[安捷伦3458A原理图，要的拿走]]></description>
      <category>资料区</category>
      <author>allen321678</author>
      <pubDate>Wed, 13 Aug 2025 00:46:28 +0000</pubDate>
    </item>
    <item>
      <title>tessent 2024.4 in system test</title>
      <link>https://bbs.eetop.wang/thread-993219-1-1.html</link>
      <description><![CDATA[tessent 2024.4 in system test pdf]]></description>
      <category>资料区</category>
      <author>orange1234</author>
      <pubDate>Tue, 05 Aug 2025 03:17:49 +0000</pubDate>
    </item>
    <item>
      <title>JESD47K_Stress-Test-Driven Qualification of Integrated Circuits</title>
      <link>https://bbs.eetop.wang/thread-993120-1-1.html</link>
      <description><![CDATA[JESD47K_Stress-Test-Driven Qualification of Integrated Circuits]]></description>
      <category>资料区</category>
      <author>dandan2</author>
      <pubDate>Sat, 02 Aug 2025 02:34:54 +0000</pubDate>
    </item>
    <item>
      <title>【国家级本科规划教材】集成电路设计(第3版) [王志功 著]</title>
      <link>https://bbs.eetop.wang/thread-991949-1-1.html</link>
      <description><![CDATA[全书共12章，以设计流程为主线，涵盖材料特性、制造工艺、器件模型、SPICE仿真工具应用及版图设计原理等内容，重点解析模拟集成电路基本单元（如电流源、运算放大器）和数字电路模块（CMOS门电路、存储器结构）的设计方法，并涉及硬件描述语言与测试封装技术。书中附有 ...]]></description>
      <category>资料区</category>
      <author>joshuacp</author>
      <pubDate>Tue, 08 Jul 2025 07:55:27 +0000</pubDate>
    </item>
    <item>
      <title>希望删除本贴，谢谢！</title>
      <link>https://bbs.eetop.wang/thread-991938-1-1.html</link>
      <description><![CDATA[希望删除本贴，谢谢！]]></description>
      <category>资料区</category>
      <author>aimee_ququ</author>
      <pubDate>Tue, 08 Jul 2025 06:14:59 +0000</pubDate>
    </item>
    <item>
      <title>SmartCtrl Pro 2024.1</title>
      <link>https://bbs.eetop.wang/thread-991213-1-1.html</link>
      <description><![CDATA[SmartCtrl是专门应用于电力电子领域的控制器设计软件。其特性为用户界面友好，工作流程简单，控制回路稳定性和性能的显示界面清晰易懂。使用SmartCtrl，用户可以轻松快速的设计各种功率转换器的控制器。
SmartCtrl提供了升压，降压，升降压，反激，正激，功率因子修正转 ...]]></description>
      <category>资料区</category>
      <author>taiyue030</author>
      <pubDate>Sat, 21 Jun 2025 12:27:40 +0000</pubDate>
    </item>
    <item>
      <title>J-STD-002E-2017元器件引子、焊、接柱和导可焊（中文版）</title>
      <link>https://bbs.eetop.wang/thread-990626-1-1.html</link>
      <description><![CDATA[IPCEIAIPCJEDECJ-STD-002E-2017元器件引子、焊、接柱和导可焊（中文版）]]></description>
      <category>资料区</category>
      <author>flamingo123</author>
      <pubDate>Wed, 11 Jun 2025 05:10:22 +0000</pubDate>
    </item>
    <item>
      <title>DFT Scan and ATPG Training student workbook-mentor</title>
      <link>https://bbs.eetop.wang/thread-990206-1-1.html</link>
      <description><![CDATA[DFT Scan and ATPG Training student workbook-mentor]]></description>
      <category>资料区</category>
      <author>chengjjsihan</author>
      <pubDate>Mon, 02 Jun 2025 06:51:28 +0000</pubDate>
    </item>
    <item>
      <title>求ieee上的论文</title>
      <link>https://bbs.eetop.wang/thread-989946-1-1.html</link>
      <description><![CDATA[Enhancing DFT Performance: The Power of Scan Compression and Lockup Latches | IEEE Conference Publication | IEEE Xplore

A novel fully automated multi-mode scan stitching methodology | IEEE Conference Publication | IEEE Xplore
An efficient scandump m .]]></description>
      <category>资料区</category>
      <author>zlyzzz1</author>
      <pubDate>Mon, 26 May 2025 14:19:59 +0000</pubDate>
    </item>
    <item>
      <title>IEC 60747-9（2019年 Edition 3.0）IGBT动态参数测试方法</title>
      <link>https://bbs.eetop.wang/thread-989612-1-1.html</link>
      <description><![CDATA[IEC 60747-9（2019年 Edition 3.0）IGBT动态参数测试方法]]></description>
      <category>资料区</category>
      <author>flamingo123</author>
      <pubDate>Tue, 20 May 2025 07:11:51 +0000</pubDate>
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