找一篇 Theses:Device-Circuit Reliability Co-Design in High voltage

Capricorn0115

•   etd@IISc
• Division of Electrical, Electronics, and Computer Science (EECS)
• Electronic Systems Engineering (ESE)
  

Device-Circuit Reliability Co-Design in High voltage and Power devices
由 HB Variar 著作 · 2022
The first part of this work strives to bridge the device-circuit co-design gap that has severely limited predictive modelling of circuits for high power applications such as Radio Frequency Power Amplifiers (RF PAs) using high power devices LDMOSs and GaN HEMTs.

Capricorn0115

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