degradation of sample-and-hold amplifier in 130nm CMOS

semico_ljj

論文名稱 Circuit performance degradation of sample-and-hold amplifier due to gate-oxide overstress in a 130-nm CMOS process
指導教授 Ming-Dou Ker


期刊 J.-S. Chen and Ming-Dou Ker, Circuit performance degradation of sample-and-hold amplifier due to gate-oxide overstress in a 130-nm CMOS process, Proc. of 2006 IEEE International Reliability Physics Symposium (IRPS), San Jose, California, USA, Mar. 26-30, 2006, pp.705-706
摘要         The effect of gate-oxide reliability on MOS switch in the bootstrapped circuit is investigated with the sample-and-hold amplifier in a 130-nm CMOS process. After overstress on the MOS switch of sample-and-hold amplifier, the circuit performances in the frequency domain are measured to verify the impact of gate-oxide reliability on circuit performance.

fanjx

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fanjx

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s8553warrior

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novaming

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accel30

Dingding

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顶一下再下。。